The integration of in-the-lens acceleration and deceleration of the electron beam results in minimization of the effects of lens aberrations at low kV, yielding higher resolution at the lowest accelerating voltages. With no electromagnetic leakage below the lens it is ideal for imaging magnetic materials and analyzing samples with EBSD. The JSM-IT800 utilizes a hybrid objective lens that combines electromagnetic and electrostatic lenses with through-the-lens electron detection system. This highly versatile, easy-to-use field emission SEM offers the next level of analytical intelligence in FE-SEM. Powerful - The IT800SHL is JEOL’s flagship FE SEM with sub-nm resolution, up to 2,000,000X magnification and an accelerating voltage range of 0.01 to 30kV, making it possible to acquire stunning details of nanostructures alongside comprehensive elemental analysis. JEOL’s unique Soft X-ray Emission Spectrometer allows efficient and parallel collection of very low-energy X-rays while providing unprecedented chemical state analysis.
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The JEOL SEM seamlessly integrates optical imaging and navigation, SEM imaging, and EDS Live Analysis with one-click operation.įlexible - The JSM-IT800 series is equipped with a large specimen chamber that accommodates a wide variety of detectors simultaneously, including: multiple EDS, WDS, STEM, BSE, and CL.
Live EDS analysis allows direct monitoring of specimen chemical composition during imaging.
Advanced AI algorithms optimize control of electron lenses in real time, correct electron trajectories and automatically align the beam, all while correcting focus, brightness/contrast, and astigmatism. The JEOL NEOENGINE® electron beam control system and advanced auto functions provide fast transitions between high resolution imaging and high current analyses, without sacrificing performance, resulting in unprecedented ease of use.
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Elegant functionality, ultrahigh resolution, and powerful software enable seamless acquisition of data from observation to elemental analysis and subsequent reporting. Smart - The IT800 series of Schottky Field Emission SEMs with embedded JEOL Energy Dispersive X-ray (EDS) streamlines operation and workflow efficiency. The JEOL IT800 series offers the next level of analytical intelligence for high spatial resolution imaging and analysis at the nanoscale. The JEOL IT800 Ultrahigh Resolution Field Emission SEM is a revolutionary FE-SEM with the most advanced high-resolution analytical technology available today.
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